ADC Histogram Test Using Triangular Stimulus Signals

Francisco André Corrêa Alegria

doi:10.30574/gjeta.2023.16.3.0188

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ADC Histogram Test Using Triangular Stimulus Signals

Francisco André Corrêa Alegria ^*

Telecommunications Institute, Instituto Superior Técnico, University of Lisbon, Av. Rovisco Pais, 1, 1049 Lisbon, Portugal.

Research Article

Global Journal of Engineering and Technology Advances, 2023, 16(03), 121–133.

Article DOI: 10.30574/gjeta.2023.16.3.0188

DOI url: https://doi.org/10.30574/gjeta.2023.16.3.0188

Publication history

Received on 26 July 2023; revised on 08 September 2023; accepted on 11 September 2023

Abstract

This paper focuses on tackling the uncertainty in ADC testing estimates using the Histogram Method with a triangular stimulus instead of a sinusoidal one as is standard practice. It introduces expressions to calculate the standard deviation of transition voltages and code bin widths.

Keywords

Analog-to-Digital Converter; Histogram Method; Testing; Uncertainty; Noise

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How to cite this article

Francisco André Corrêa Alegria. ADC Histogram Test Using Triangular Stimulus Signals. Global Journal of Engineering and Technology Advances, 2023, 16(3), 121-133. Article DOI: https://doi.org/10.30574/gjeta.2023.16.3.0188

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