Better approximation for the precision of the number of counts in the histogram test of ADCs

Francisco André Corrêa Alegria *
Telecommunications Institute / Instituto Superior Técnico, University of Lisbon, , Portugal.
 
Review Article
Global Journal of Engineering and Technology Advances, 2023, 17(01), 123–129.
Article DOI: 10.30574/gjeta.2023.17.1.0212
Publication history: 
Received on 04 September 2023; revised on 10 October 2023; accepted on 13 October 2023
 
Abstract: 
Here one proposes a new analytical expression that can be used to estimate the precision of the estimates made with the histogram test of analog-to-digital converters as a function of the additive noise standard deviation present in the test setup. This can be advantageously used to determine the minimum samples that should be acquired in order to achieve a certain level of precision on the estimates made. A more rigorous choice of the number of samples makes the characterization more efficient and less time consuming.
 
Keywords: 
Analog-to-digital converter; Characterization; Histogram Test Method; Precision; Approximate Expression
 
Full text article in PDF: